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Professional AFM Images with a Three Step Click SmartScan by Park Systems Nov 25, 2014

Revolutionizes Atomic Force Microscopy by Automatizing the Imaging Process

Park Systems, a leader in Atomic Force Microscopy (AFM) since 1997 announced today that they will debut an industry changing AFM auto image scanning mode for their AFM systems at the MRS Fall show in Boston. SmartScan fully automatizes AFM imaging making it very easy for anyone to take an image of a sample at nanoscale resolution and clarity comparable to one taken by an expert. SmartScan opens up the power of AFM nanoscopic tools to everyone and drastically boosts the productivity of all users. The new SmartScan operating software for Park AFM systems will be provided at no cost to all existing Park NX AFM user, and it will be standard on all NX-Series equipment from 2015.


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