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Metrology

Buyer's guide > Tools, analysis and lab supplies > Metrology

Showing product 1 to 20 of 576 in Metrology.
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  1. Quorum Technologies wins Queen’s Award for Enterprise
    Quorum Technologies Apr 22, 2014

    Quorum Technologies is proud to receive the Queen’s Award for International Trade.

  2.   Lake Shore showcasing cryogenic probe stations at MRS Spring
    Lake Shore Cryotronics, Inc. Apr 15, 2014

    Lake Shore showcasing cryogenic probe stations, including entry-level TTPX, at MRS Spring.

  3. Lake Shore slated to receive Phase II Air Force grant
    Lake Shore Cryotronics, Inc. Jan 23, 2014

    Columbus, Ohio (January 23, 2014)- Lake Shore slated to receive Phase II Air Force grant for terahertz system development.

  4.   Piezo controller series NV120/1 and NV120/1 CLE for dynamic applications
    piezosystem jena GmbH Oct 14, 2014

    piezosystem jena is a worldwide leader in nano and micro positioning. The NV120 series of piezo controllers is an excellent solution for the control of piezo actuators in dynamic applications.

  5.   Digital piezo amplifier nano box USB
    piezosystem jena GmbH Jul 9, 2014

    Digital control for all D-actuators from piezosystem jena

  6.   PZ 250 CAP WL High Precise Wafer
    piezosystem jena GmbH Jul 4, 2014

    The piezosystem jena GmbH now offers a positioning system for the inspection of larger wafers with a diameter up to 12” using precise hold and repeat positioning with the same precise precision.

  7.   nPXY60Z20-257 / nPXY60-258
    nPoint Inc. May 14, 2014

    The NPXY60 piezo stages are the latest additions to nPoint’s nanopositioning lineup. These stages are designed for advanced research markets in need of UHV and non-magnetic positioning capabilities.

  8. Spectral Response/Quantum Efficiency Measurement System
    Enli Technology Co., Ltd Nov 21, 2014

    Enlitech’s QE system is developed and designed in accordance with IEC, ASTM standards which provides users the one-for-all for spectral response/quantum efficiency measurement for solar cells.

  9. NPZ100-403 Piezo Stage
    nPoint Inc. Sep 18, 2014

    The NPXY100-403 piezo stage is the newest addition to nPoint’s nanopositioning lineup. This stage is designed for applications where high speed is necessary while carrying heavier loads.

  10. Cylinder scanning system used in the ZylScan-System of the Breitmeier Messtechni
    piezosystem jena GmbH Aug 6, 2014

    The visualization of the surface structure of cylinders in the range of microns is very work-intensive with insufficient results. Common methods need special cameras and objectives.

  11. glass suction cup--DV-1F 180kg
    Shanghai Toyoshi Diamond Tools Co.,Ltd May 13, 2014

    Brand Name TOYOSHI Model Number DV-1F material rubber pad dimmeter 8'' color blue Type Other Place of Origin Tianjin China (Mainland)

  12. Nanosurf FlexAFM
    Nanosurf AG Mar 28, 2014

    Your Versatile Research AFM for Materials & Life Science

  13. nPXY200-401
    nPoint Inc. Mar 26, 2014

    The NPXY200-401 is the latest addition to nPoint’s piezo stage lineup. This new stage is designed for advanced research and OEM markets where speed, precision, and flexibility are required.

  14. Diode lasers for the more demanding application
    Elliot Scientific Ltd. Dec 3, 2013

    A high stability diode OEM laser with diffraction limited performance for more demanding applications is now offered by Elliot Scientific. Wavelengths available are within the range 375 to 1550 nm.

  15. Sarfus Mapping Stations from Nanolane
    NANOLANE Nov 22, 2013

    Nanolane offers its new generation of Sarfus Mapping stations, label-free analytical instruments for real-time sample characterization at nanoscale (down to 0.1nm or 1ng/cm²).

  16. 508 PV™ adds UV-VIS-NIR spectrophotometry and imaging to legacy microscopes
    Elliot Scientific Ltd. Oct 4, 2013

    Elliot Scientific is now offering the new 508 PV™ UV-visible-NIR spectrophotometer to microscopists and physicists in the UK and Ireland.

  17. AFM Image Contest announced by Park Systems.
    Park Systems Oct 4, 2013

    Park Systems, a leader in AFM since 1997 announced today their first AFM image contest beginning Aug 26-Nov 1, 2013 for scientists, engineers, researchers and others who work with AFM.

  18. Park Systems Announces PinPoint Conductive Atomic Force Microscopy (AFM)
    Park Systems Oct 4, 2013

    Park Systems announced the PinPoint Counductive AFM, an extremely accurate conductive measurement technology at nano-scale resolution for failure analysis (FA) in the semiconductor industry.

  19. FluidFM Webinar: Advancing Single Cell Manipulation and Analysis
    Nanosurf AG Sep 5, 2013

    Fluid Force Microscopy (FluidFM) combines the unique possibilities of nanofluidics with the positional accuracy and force sensitivity of the atomic force microscope...

  20. NPXY50-286 Nanopositioning Piezo Stage
    nPoint Inc. Aug 22, 2013

    The NPXY50-286 is the latest addition to nPoint’s piezo stage lineup. The stage is designed for high specification research and OEM markets where small size, fast speed, and high resolution are ideal.

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