Sensing and actuating
Buyer's guide > Sensing and actuating
Park NX-Wafer fully automates the automatic defect review process for bare wafer
Park Systems Jul 15, 2014
A revolutionary AFM design for bare wafer manufacturing that fully automates the automatic defect review process and increases production throughput by an astounding 1,000%.
Park Systems Collaborates with Leading Hard Disc Drive Manufacturers to Develop PTR Nanoscale Measurements that Increase Production Yields by 200 Percent.
Quorum Technologies is proud to receive the Queen’s Award for International Trade.
Lake Shore showcasing cryogenic probe stations at MRS Spring
Lake Shore Cryotronics, Inc. Apr 15, 2014
Lake Shore showcasing cryogenic probe stations, including entry-level TTPX, at MRS Spring.
An Astounding 1,000% Throughput Increase
Nanosurf AG Mar 28, 2014
Your Versatile Research AFM for Materials & Life Science
Nanosurf AG Mar 28, 2014
A unique new tool for single cell biology and beyond
The Dimension FastScanTM Atomic Force Microscope (AFM) delivers, for the first time, extreme imaging speed without sacrificing legendary Dimension© Icon© resolution and performance.
Park Systems, a leader in Atomic Force Microscopy (AFM) since 1997 announces their first AFM image contest winner, Namuna Panday, a Graduate Student at Florida International University.
Park Systems New Atomic Force Microscope Technology Surpasses Old Standards
Park Systems Mar 5, 2014
Park Systems New Atomic Force Microscope Technology Surpasses Old Standards for Semiconductor Failure Analysis Detection Ensuring Accuracy and Lowering Costs.
Powerfully Versatile Atomic Force Microscope with Unique MultiSampleTM Scan
Columbus, Ohio (January 23, 2014)- Lake Shore slated to receive Phase II Air Force grant for terahertz system development.
Nanosurf AG Jan 15, 2014
An all-in-one AFM for nano education and small samples.
- Building on our extensive catalogue of incoherent light sources (Xe, Hg(Xe), QTH)
NEW ILT950 UV Spectroradiometer
LOT-QuantumDesign Ltd Jan 14, 2014
The excellent performance of the original ILT950 spectroradiometer has been enhanced with the addition of a new machined optical bench for reduced stray light and improved thermal stability.
Park Systems Unveils New Park XE15
Park Systems Jan 6, 2014
Powerfully Versatile Atomic Force Microscope with Unique MultiSample™ Scan.
Park Systems Introduces QuickStep SCM
Park Systems Dec 2, 2013
New High Speed Scanning Capacitance Microscopy
Lake Shore to feature new DC Hall measurement system at MRS Fall Meeting 2013
Lake Shore Cryotronics, Inc. Nov 27, 2013
Columbus, Ohio (November 27, 2013)
Lake Shore to Exhibit Materials Characterization Systems at SEMICON West 2013
Lake Shore Cryotronics, Inc. Jul 3, 2013
Columbus, OH (July 2, 2013) – Lake Shore Cryotronics will highlight its range of industry-leading materials characterization solutions...
Piezo controller series NV120/1 and NV120/1 CLE for dynamic applications
piezosystem jena GmbH Oct 14, 2014
piezosystem jena is a worldwide leader in nano and micro positioning. The NV120 series of piezo controllers is an excellent solution for the control of piezo actuators in dynamic applications.