This site uses cookies. By continuing to use this site you agree to our use of cookies. To find out more, see our Privacy and Cookies policy.
Skip to the content

IOP A community website from IOP Publishing

Product category

Scanning probe microscopy

Buyer's guide > Scanning probe microscopy

Showing product 1 to 20 of 1,222 in Scanning probe microscopy.
Result page: 1 2 3 4 5 6 7 8 9 10 Next »

  1. More Space for Future Development: PI miCos Enhances Capacities for Precision Po
    PI (Physik Instrumente) Piezo Nano Positioning Feb 13, 2015

    PI miCos builds on expansion: After only eight months construction time, the PI subsidiary moved into the new building section at its Eschbach location near Freiburg.

  2.   NT-MDT at Fall MRS 2014 It’s All Action With Your AFM & Raman Company!
    NT-MDT Nov 27, 2014

    Sponsoring Key MRS Symposium on Advances in Scanning Probe Microscopy for Multimodal Imaging at the Nanoscale MRS 2014 December 1st-December 4th Symposium PP.

  3.   Park NX-Wafer fully automates the automatic defect review process for bare wafer
    Park Systems Jul 15, 2014

    A revolutionary AFM design for bare wafer manufacturing that fully automates the automatic defect review process and increases production throughput by an astounding 1,000%.

  4. PTR Nanoscale Measurements that Increase Production Yields by 200 Percent
    Park Systems May 29, 2014

    Park Systems Collaborates with Leading Hard Disc Drive Manufacturers to Develop PTR Nanoscale Measurements that Increase Production Yields by 200 Percent.

  5. Quorum Technologies wins Queen’s Award for Enterprise
    Quorum Technologies Apr 22, 2014

    Quorum Technologies is proud to receive the Queen’s Award for International Trade.

  6.   Lake Shore showcasing cryogenic probe stations at MRS Spring
    Lake Shore Cryotronics, Inc. Apr 15, 2014

    Lake Shore showcasing cryogenic probe stations, including entry-level TTPX, at MRS Spring.

  7. Park Systems Introduces Automatic Defect Review for Semiconductor Wafers
    Park Systems Apr 3, 2014

    An Astounding 1,000% Throughput Increase

  8.   Piezo controller series NV120/1 and NV120/1 CLE for dynamic applications
    piezosystem jena GmbH Oct 14, 2014

    piezosystem jena is a worldwide leader in nano and micro positioning. The NV120 series of piezo controllers is an excellent solution for the control of piezo actuators in dynamic applications.

  9.   New mirror tilting system PSH25 OEM
    piezosystem jena GmbH Sep 29, 2014

    The PSH25 OEM is a development of the mirror tilting systems PSH series offered by piezosystem jena. The series serves the fast and precise positioning of optical components like mirrors or prisms.

  10.   Micro-system-handling with piezosystem jena
    piezosystem jena GmbH Jul 17, 2014

    The fiber gripper Grippy 3 offered by piezosystem jena has been designed for use in applications like handling of fibers and samples manipulation e.g. microoptics.

  11.   Digital piezo amplifier nano box USB
    piezosystem jena GmbH Jul 9, 2014

    Digital control for all D-actuators from piezosystem jena

  12.   PZ 250 CAP WL High Precise Wafer
    piezosystem jena GmbH Jul 4, 2014

    The piezosystem jena GmbH now offers a positioning system for the inspection of larger wafers with a diameter up to 12” using precise hold and repeat positioning with the same precise precision.

  13.   RISE Microscopy - Correlative Raman Imaging and Scanning Electron Microscopy
    LOT-QuantumDesign Ltd Jun 26, 2014

    - World's first fully-integrated Raman Imaging and Scanning Electron Microscope

  14.   nPXY60Z20-257 / nPXY60-258
    nPoint Inc. May 14, 2014

    The NPXY60 piezo stages are the latest additions to nPoint’s nanopositioning lineup. These stages are designed for advanced research markets in need of UHV and non-magnetic positioning capabilities.

  15. NPXY250-405 Piezo Stage
    nPoint Inc. Mar 13, 2015

    The NPXY250-405 piezo stage is the latest addition to nPoint’s nanopositioning lineup. This stage is designed as an economical XY piezo flexure stage.

  16. DSSC Solar Cell Quantum Efficiency Measurement System
    Enli Technology Co., Ltd Feb 17, 2015

    A testing tool to test Quantum Efficiency / Spectral Response / Incident photon to converted electron of solar cells, especially for Dye-sensitized (DSSC) and Photoelectrochemical (PEC) solar cells.

  17. SR-156 Solar Cell Full-Area Spectral Response Measurement System
    Enli Technology Co., Ltd Feb 17, 2015

    A solar cell spectral response measurement system is exclusively designed by Enli Technology Co., Ltd., the full-area (156×156 mm2 ) illumination can measure the spectral response of the whole cell.

  18. Class AAA Steady-State Solar Simulator
    Enli Technology Co., Ltd Feb 17, 2015

    Enlitech’s class AAA Steady-State Solar Simulator is designed in accordance with the standard of IEC 60904-9 and ASTM E927 to measure the efficiency for solar cells. The output beam size is 50 x 50mm.

  19. From a microscope to a nanoscope (STED Microscopy)
    piezosystem jena GmbH Feb 17, 2015

    In the STED Microscopy method, a cell is excited by a diffraction-limited laser source. Immediately this cell is then overlaid by another laser source.

  20. Professional AFM Images with a Three Step Click SmartScan by Park Systems
    Park Systems Nov 25, 2014

    Revolutionizes Atomic Force Microscopy by Automatizing the Imaging Process

Result page: 1 2 3 4 5 6 7 8 9 10 Next »