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Scanning probe microscopy

Buyer's guide > Scanning probe microscopy

Showing product 1 to 20 of 1,212 in Scanning probe microscopy.
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  1.   NT-MDT at Fall MRS 2014 It’s All Action With Your AFM & Raman Company!
    NT-MDT Nov 27, 2014

    Sponsoring Key MRS Symposium on Advances in Scanning Probe Microscopy for Multimodal Imaging at the Nanoscale MRS 2014 December 1st-December 4th Symposium PP.

  2.   Professional AFM Images with a Three Step Click SmartScan by Park Systems
    Park Systems Nov 25, 2014

    Revolutionizes Atomic Force Microscopy by Automatizing the Imaging Process

  3.   Park NX-Wafer fully automates the automatic defect review process for bare wafer
    Park Systems Jul 15, 2014

    A revolutionary AFM design for bare wafer manufacturing that fully automates the automatic defect review process and increases production throughput by an astounding 1,000%.

  4. PTR Nanoscale Measurements that Increase Production Yields by 200 Percent
    Park Systems May 29, 2014

    Park Systems Collaborates with Leading Hard Disc Drive Manufacturers to Develop PTR Nanoscale Measurements that Increase Production Yields by 200 Percent.

  5. Quorum Technologies wins Queen’s Award for Enterprise
    Quorum Technologies Apr 22, 2014

    Quorum Technologies is proud to receive the Queen’s Award for International Trade.

  6.   Lake Shore showcasing cryogenic probe stations at MRS Spring
    Lake Shore Cryotronics, Inc. Apr 15, 2014

    Lake Shore showcasing cryogenic probe stations, including entry-level TTPX, at MRS Spring.

  7. Park Systems Introduces Automatic Defect Review for Semiconductor Wafers
    Park Systems Apr 3, 2014

    An Astounding 1,000% Throughput Increase

  8.   Park Systems 2014 Announces Atomic Force Microscopy Image Contest Winner
    Park Systems Mar 5, 2014

    Park Systems, a leader in Atomic Force Microscopy (AFM) since 1997 announces their first AFM image contest winner, Namuna Panday, a Graduate Student at Florida International University.

  9.   Park Systems New Atomic Force Microscope Technology Surpasses Old Standards
    Park Systems Mar 5, 2014

    Park Systems New Atomic Force Microscope Technology Surpasses Old Standards for Semiconductor Failure Analysis Detection Ensuring Accuracy and Lowering Costs.

  10.   Park Systems XE15 Atomic Force Microscope
    LOT-QuantumDesign Ltd Feb 4, 2014

    Powerfully Versatile Atomic Force Microscope with Unique MultiSampleTM Scan

  11. Lake Shore slated to receive Phase II Air Force grant
    Lake Shore Cryotronics, Inc. Jan 23, 2014

    Columbus, Ohio (January 23, 2014)- Lake Shore slated to receive Phase II Air Force grant for terahertz system development.

  12.   Park Systems Unveils New Park XE15
    Park Systems Jan 6, 2014

    Powerfully Versatile Atomic Force Microscope with Unique MultiSample™ Scan.

  13.   Piezo controller series NV120/1 and NV120/1 CLE for dynamic applications
    piezosystem jena GmbH Oct 14, 2014

    piezosystem jena is a worldwide leader in nano and micro positioning. The NV120 series of piezo controllers is an excellent solution for the control of piezo actuators in dynamic applications.

  14.   New mirror tilting system PSH25 OEM
    piezosystem jena GmbH Sep 29, 2014

    The PSH25 OEM is a development of the mirror tilting systems PSH series offered by piezosystem jena. The series serves the fast and precise positioning of optical components like mirrors or prisms.

  15.   Micro-system-handling with piezosystem jena
    piezosystem jena GmbH Jul 17, 2014

    The fiber gripper Grippy 3 offered by piezosystem jena has been designed for use in applications like handling of fibers and samples manipulation e.g. microoptics.

  16.   Digital piezo amplifier nano box USB
    piezosystem jena GmbH Jul 9, 2014

    Digital control for all D-actuators from piezosystem jena

  17.   PZ 250 CAP WL High Precise Wafer
    piezosystem jena GmbH Jul 4, 2014

    The piezosystem jena GmbH now offers a positioning system for the inspection of larger wafers with a diameter up to 12” using precise hold and repeat positioning with the same precise precision.

  18.   RISE Microscopy - Correlative Raman Imaging and Scanning Electron Microscopy
    LOT-QuantumDesign Ltd Jun 26, 2014

    - World's first fully-integrated Raman Imaging and Scanning Electron Microscope

  19.   nPXY60Z20-257 / nPXY60-258
    nPoint Inc. May 14, 2014

    The NPXY60 piezo stages are the latest additions to nPoint’s nanopositioning lineup. These stages are designed for advanced research markets in need of UHV and non-magnetic positioning capabilities.

  20. Spectral Response/Quantum Efficiency Measurement System
    Enli Technology Co., Ltd Nov 21, 2014

    Enlitech’s QE system is developed and designed in accordance with IEC, ASTM standards which provides users the one-for-all for spectral response/quantum efficiency measurement for solar cells.

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