Scanning probe microscopy
Sponsored by Bruker Nano Surfaces
PeakForce Tapping™ is the most significant breakthrough in AFM technology since the advent of TappingMode™. By applying a precisely controlled force response curve at every pixel, PeakForce Tapping permits the use of reduced imaging forces, protecting both fragile probes and samples with no decrease in image resolution.
Mar 21, 2014
Low intensity lasers manipulate objects the size of a virus
May 29, 2013
Pump-probe technique beats the diffraction limit of light – without the need for labels
Feb 8, 2013
Molecular samples detected and imaged at room temperature.
Dec 14, 2012
Find out which nanotechnology breakthroughs made it into our review of the year.
Apr 10, 2014
An unexpected route to high-resolution atomic force microscopy.
Mar 14, 2014
An easy route to quantitative nanoscale electrical characterisation at GHz frequencies.
Oct 4, 2013
An appropriate loading force is essential in nanoscale electrical characterization by Conductive Atomic Force Microscopy
May 8, 2013
Scanning plasmonic ridge aperture senses changes in refractive index and absorption of nanostructures, which is useful for detecting voids or defects in a sample.
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Apr 15, 2014