Scanning probe microscopy
Sponsored by Bruker Nano Surfaces
Advanced property measurements have played a key role in the exciting AFM discoveries in graphene research. This research includes quantitative mechanical property mapping with Bruker’s exclusive PeakForce QNM®. Bruker’s unique nanoelectrical AFM modes are anticipated to provide important new insights into nanoscale variations of graphene conductivity and work function.
May 29, 2013
Pump-probe technique beats the diffraction limit of light – without the need for labels
Feb 8, 2013
Molecular samples detected and imaged at room temperature.
Dec 14, 2012
Find out which nanotechnology breakthroughs made it into our review of the year.
Nov 16, 2012
Wax-infused nanotube "yarns" could find use in robotics, micromotors and intelligent textiles.
Oct 4, 2013
An appropriate loading force is essential in nanoscale electrical characterization by Conductive Atomic Force Microscopy
May 8, 2013
Scanning plasmonic ridge aperture senses changes in refractive index and absorption of nanostructures, which is useful for detecting voids or defects in a sample.
May 2, 2013
Continuous imaging during patterned optical illumination allows surface morphology, roughness and particle size distribution to be spatially and statistically monitored as a function of time.
Oct 16, 2012
Nano-oscillations analysed to further understand scanning probe microscopy techniques.
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Mar 5, 2014