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IOP A community website from IOP Publishing

online seminar

       

Environmental effects of oxide nanomaterials

Stanislaus Wong presents on the role of chemical composition, morphology, structure, size, and shape in the toxicity of nanomaterials

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Scanning probe microscopy

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Bruker’s Inspire™ delivers, for the first time, highest-resolution nanoscale chemical and property mapping combined with radical productivity advances and uncompromised AFM performance. The integrated, self-optimizing system acquires nanoscale infrared absorption and reflection maps at regular AFM imaging speeds, without the limitations of indirect mechanical approaches or added complexity for the user.

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Technology update

Testing the state of electroluminescence losses

Scanning tunnelling luminescence studies reveal mechanisms behind efficiency losses in gallium arsenide devices.

STM avoids “tip crash”

Tokyo researchers measure the electrical conductance at specific sites on a single-atom point contact using a scanning tunnelling microscopy technique.

Surface structure can tailor adhesion

(with audio) By making gold nanoparticles with different shapes, researchers have identified how surface atomic structures affect friction and adhesion.

Automated software brings AFM to the masses

Park Systems introduces fully automated atomic force microscope systems that mean users don’t need technical expertise.

Lab talk

Synchrotron X-ray probes strained single nanowires

A combined nano-focused X-ray diffraction and Raman investigation of structural properties for novel opto-electronic devices.

Controlling magnetism at the nanoscale in magnetoresistive sensors

Effective matching of material properties and sensor geometries delivers sensitivities of 3.7%/mT in sub-200nm magnetic tunnel junctions

Breaking the limits for spatial resolution with elemental sensitivity

Researchers combine high-resolution microscopy techniques with the uniquely high chemical sensitivity of secondary ion mass spectroscopy

Nanomechanical spectroscopy in tapping mode atomic force microscopy

Extracting quantitative information at the nanoscale with an efficient force reconstruction method.