Scanning probe microscopy
Sponsored by Bruker Nano Surfaces
Bruker’s Inspire™ delivers, for the first time, highest-resolution nanoscale chemical and property mapping combined with radical productivity advances and uncompromised AFM performance. The integrated, self-optimizing system acquires nanoscale infrared absorption and reflection maps at regular AFM imaging speeds, without the limitations of indirect mechanical approaches or added complexity for the user.
Aug 24, 2015
Scanning tunnelling luminescence studies reveal mechanisms behind efficiency losses in gallium arsenide devices.
Jun 1, 2015
Tokyo researchers measure the electrical conductance at specific sites on a single-atom point contact using a scanning tunnelling microscopy technique.
Mar 13, 2015
(with audio) By making gold nanoparticles with different shapes, researchers have identified how surface atomic structures affect friction and adhesion.
Dec 15, 2014
Park Systems introduces fully automated atomic force microscope systems that mean users don’t need technical expertise.
Feb 8, 2016
A combined nano-focused X-ray diffraction and Raman investigation of structural properties for novel opto-electronic devices.
Jan 25, 2016
Effective matching of material properties and sensor geometries delivers sensitivities of 3.7%/mT in sub-200nm magnetic tunnel junctions
Oct 6, 2015
Researchers combine high-resolution microscopy techniques with the uniquely high chemical sensitivity of secondary ion mass spectroscopy
Apr 17, 2015
Extracting quantitative information at the nanoscale with an efficient force reconstruction method.
This channel comprises content supplied by vendors.
Jun 5, 2015