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nanotechweb.org spring round-up


     

We look at the top stories on nanotechweb.org over the first three months of 2015.

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Buyer’s Guide

Scanning probe microscopy

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Lab talk

Nanotechnology research highlights: find out what the authors have to say

Nanomechanical spectroscopy in tapping mode atomic force microscopy

Extracting quantitative information at the nanoscale with an efficient force reconstruction method.

Systematically sharpening atomic force microscopy images

Optimising probe excitation frequency for the characterization of soft visoeleastic surfaces.

Imaging atomically precise donor devices inside a silicon crystal

Advancing the fabrication of semiconductor qubits.

Characterizing the subsurface of polymer nanocomposites

Atomic Force Microscopy provides quantitative non-invasive analysis of composite properties.

Dual-tips improve magnetic-field imaging at the nanoscale

Exploring magnetically soft objects with segregated topological and magnetic scans.

Multifrequency atomic force microscopy: material properties on the nanoscale

Analysis of multiple eigenmodes in AFM reveals surface properties.

Theory connects scanning tunnelling techniques

Theoretical descriptions of scanning tunnelling potentiometry could extend the scope of the technique to observe the same features as scanning tunnelling microscopy.

Understanding the signal in electrochemical strain microscopy

Novel technique measures ion concentration and diffusion qualitatively.

Mechanical properties of coal on the nanoscale

Novel atomic force microscopy methods probe the properties of coal.

The voltage drop across atoms

Atomic-scale voltage drop imaging can be used to improve nanoelectronics.

Nanoscale position sensors: spintronics offer a low-cost alternative to optics

Detecting changes in magnetic field for high-speed sensing.

Seeing atoms under viscous conditions

An unexpected route to high-resolution atomic force microscopy

Calibrating the scanning microwave microscope in situ

An easy route to quantitative nanoscale electrical characterisation at GHz frequencies

Improving contact quality in AFM-based electrical measurements

An appropriate loading force is essential in nanoscale electrical characterization by Conductive Atomic Force Microscopy

Plasmonic nanoscope measures heterogeneous nanostructures

Scanning plasmonic ridge aperture senses changes in refractive index and absorption of nanostructures, which is useful for detecting voids or defects in a sample.

AFM captures dynamics of photodissolution

Continuous imaging during patterned optical illumination allows surface morphology, roughness and particle size distribution to be spatially and statistically monitored as a function of time.

Model interprets dynamic scanning electron microscopy of vibrating cantilevers

Nano-oscillations analysed to further understand scanning probe microscopy techniques.

Mechanical stability defines imaging quality of nanoprobes

Model guides the selection and design of carbon nanotubes as scanning tips and nanomanipulators.

Resist layer correlation joins up nanopatterns

Surface roughness fingerprint allows sub-nanometre positioning without alignment marks.

SPM tip apex defined using field ion microscopy

Analysis reveals atomic structure at the very apex of the probe and will lead to a better understanding of nanoscale mechanics and electronic transport.