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Riccardo Sapienza: Using biomaterials for photonics

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Buyer’s Guide

Scanning probe microscopy

Sponsored by Bruker Nano Surfaces

Bruker’s Inspire™ delivers, for the first time, highest-resolution nanoscale chemical and property mapping combined with radical productivity advances and uncompromised AFM performance. The integrated, self-optimizing system acquires nanoscale infrared absorption and reflection maps at regular AFM imaging speeds, without the limitations of indirect mechanical approaches or added complexity for the user.

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Lab talk

Nanotechnology research highlights: find out what the authors have to say

Imaging atomically precise donor devices inside a silicon crystal

Advancing the fabrication of semiconductor qubits.

Characterizing the subsurface of polymer nanocomposites

Atomic Force Microscopy provides quantitative non-invasive analysis of composite properties.

Dual-tips improve magnetic-field imaging at the nanoscale

Exploring magnetically soft objects with segregated topological and magnetic scans.

Multifrequency atomic force microscopy: material properties on the nanoscale

Analysis of multiple eigenmodes in AFM reveals surface properties.

Theory connects scanning tunnelling techniques

Theoretical descriptions of scanning tunnelling potentiometry could extend the scope of the technique to observe the same features as scanning tunnelling microscopy.

Understanding the signal in electrochemical strain microscopy

Novel technique measures ion concentration and diffusion qualitatively.

Mechanical properties of coal on the nanoscale

Novel atomic force microscopy methods probe the properties of coal.

The voltage drop across atoms

Atomic-scale voltage drop imaging can be used to improve nanoelectronics.

Nanoscale position sensors: spintronics offer a low-cost alternative to optics

Detecting changes in magnetic field for high-speed sensing.

Seeing atoms under viscous conditions

An unexpected route to high-resolution atomic force microscopy

Calibrating the scanning microwave microscope in situ

An easy route to quantitative nanoscale electrical characterisation at GHz frequencies

Improving contact quality in AFM-based electrical measurements

An appropriate loading force is essential in nanoscale electrical characterization by Conductive Atomic Force Microscopy

Plasmonic nanoscope measures heterogeneous nanostructures

Scanning plasmonic ridge aperture senses changes in refractive index and absorption of nanostructures, which is useful for detecting voids or defects in a sample.

AFM captures dynamics of photodissolution

Continuous imaging during patterned optical illumination allows surface morphology, roughness and particle size distribution to be spatially and statistically monitored as a function of time.

Model interprets dynamic scanning electron microscopy of vibrating cantilevers

Nano-oscillations analysed to further understand scanning probe microscopy techniques.

Mechanical stability defines imaging quality of nanoprobes

Model guides the selection and design of carbon nanotubes as scanning tips and nanomanipulators.

Resist layer correlation joins up nanopatterns

Surface roughness fingerprint allows sub-nanometre positioning without alignment marks.

SPM tip apex defined using field ion microscopy

Analysis reveals atomic structure at the very apex of the probe and will lead to a better understanding of nanoscale mechanics and electronic transport.

Metal-on-silicon FET exhibits graphene-like properties

Dependence of the drain current on the drain voltage has no saturation region, similar to a field-effect transistor based on graphene.

Algorithm investigates different stable states of cantilever oscillation in AFM

Up to three coexisting stable states identified in latest study, which could help experimentalists to obtain superior images.