Scanning probe microscopy
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Nanotechnology research highlights: find out what the authors have to say
Apr 4, 2016
Laying the foundations for a new era in Kelvin Probe Force Microscopy by utilising big data capture and analytics.
Mar 7, 2016
The thickness of graphene can be accurately measured by applying high pressure with an atomic force microscope.
Feb 8, 2016
A combined nano-focused X-ray diffraction and Raman investigation of structural properties for novel opto-electronic devices.
Jan 25, 2016
Effective matching of material properties and sensor geometries delivers sensitivities of 3.7%/mT in sub-200nm magnetic tunnel junctions
Oct 6, 2015
Researchers combine high-resolution microscopy techniques with the uniquely high chemical sensitivity of secondary ion mass spectroscopy
Apr 17, 2015
Extracting quantitative information at the nanoscale with an efficient force reconstruction method.
Apr 3, 2015
Optimising probe excitation frequency for the characterization of soft visoeleastic surfaces.
Mar 2, 2015
Advancing the fabrication of semiconductor qubits.
Feb 16, 2015
Atomic Force Microscopy provides quantitative non-invasive analysis of composite properties.
Jan 14, 2015
Exploring magnetically soft objects with segregated topological and magnetic scans.
Nov 27, 2014
Analysis of multiple eigenmodes in AFM reveals surface properties.
Nov 24, 2014
Theoretical descriptions of scanning tunnelling potentiometry could extend the scope of the technique to observe the same features as scanning tunnelling microscopy.
Oct 21, 2014
Novel technique measures ion concentration and diffusion qualitatively.
Oct 14, 2014
Novel atomic force microscopy methods probe the properties of coal.
Sep 24, 2014
Atomic-scale voltage drop imaging can be used to improve nanoelectronics.
Jul 20, 2014 1 comment
Detecting changes in magnetic field for high-speed sensing.
Apr 10, 2014
An unexpected route to high-resolution atomic force microscopy
Mar 14, 2014
An easy route to quantitative nanoscale electrical characterisation at GHz frequencies
Oct 4, 2013
An appropriate loading force is essential in nanoscale electrical characterization by Conductive Atomic Force Microscopy
May 8, 2013
Scanning plasmonic ridge aperture senses changes in refractive index and absorption of nanostructures, which is useful for detecting voids or defects in a sample.