Scanning probe microscopy
Sponsored by Bruker Nano Surfaces
PeakForce Tapping™ is the most significant breakthrough in AFM technology since the advent of TappingMode™. By applying a precisely controlled force response curve at every pixel, PeakForce Tapping permits the use of reduced imaging forces, protecting both fragile probes and samples with no decrease in image resolution.
Nanotechnology research highlights: find out what the authors have to say
Jul 20, 2014
Detecting changes in magnetic field for high-speed sensing.
Apr 10, 2014
An unexpected route to high-resolution atomic force microscopy
Mar 14, 2014
An easy route to quantitative nanoscale electrical characterisation at GHz frequencies
Oct 4, 2013
An appropriate loading force is essential in nanoscale electrical characterization by Conductive Atomic Force Microscopy
May 8, 2013
Scanning plasmonic ridge aperture senses changes in refractive index and absorption of nanostructures, which is useful for detecting voids or defects in a sample.
May 2, 2013
Continuous imaging during patterned optical illumination allows surface morphology, roughness and particle size distribution to be spatially and statistically monitored as a function of time.
Oct 16, 2012
Nano-oscillations analysed to further understand scanning probe microscopy techniques.
Oct 12, 2012
Model guides the selection and design of carbon nanotubes as scanning tips and nanomanipulators.
Sep 26, 2012
Surface roughness fingerprint allows sub-nanometre positioning without alignment marks.
Sep 5, 2012
Analysis reveals atomic structure at the very apex of the probe and will lead to a better understanding of nanoscale mechanics and electronic transport.
Jul 31, 2012
Dependence of the drain current on the drain voltage has no saturation region, similar to a field-effect transistor based on graphene.
Jul 17, 2012
Up to three coexisting stable states identified in latest study, which could help experimentalists to obtain superior images.
Jul 5, 2012
Contact mode cantilever dynamics understood in two-part study.
Jun 20, 2012
AFM operating in electrostatic force microscope mode reveals evolution of force gradients in gemstone placed on thermally cycled heating stage.
Jun 14, 2012
Computer simulations demonstrate potential of optically trapped cylinders as custom probes
Jun 6, 2012
NIST and Intel team up to image advanced semiconductor interconnection structures.
Apr 26, 2012
Confined water could influence operation of ultra-fast h-BN/graphene transistors
Apr 20, 2012
Non-raster scan trajectories give a rapid preview of the entire sample area with a resolution that increases uniformly in time and space
Apr 3, 2012
Shielded AFM probe enhances spatial resolution and helps to avoid topographical artifacts by confining the electric field to a region directly below the tip
Mar 14, 2012
Embedded multilayer graphene film acts as charge trapping layer and changes the current state of the memory device in response to externally applied bias