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Key achievements and challenges in STM and AFM

Sergei Kalinin describes the impact of developing data-controlled scanning probe microscopy and future big data approaches.

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Scanning probe microscopy

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Lab talk

Nanotechnology research highlights: find out what the authors have to say

Field emission resonance as a tool for nano-scale imaging

Field enhancement and self-focus effects manifesting in field emission resonances in scanning tunnelling microscopy

Bringing Kelvin probe force microscopy into the information age

Laying the foundations for a new era in Kelvin Probe Force Microscopy by utilising big data capture and analytics.

Can atomic force microscopy really measure the thickness of graphene?

The thickness of graphene can be accurately measured by applying high pressure with an atomic force microscope.

Synchrotron X-ray probes strained single nanowires

A combined nano-focused X-ray diffraction and Raman investigation of structural properties for novel opto-electronic devices.

Controlling magnetism at the nanoscale in magnetoresistive sensors

Effective matching of material properties and sensor geometries delivers sensitivities of 3.7%/mT in sub-200nm magnetic tunnel junctions

Breaking the limits for spatial resolution with elemental sensitivity

Researchers combine high-resolution microscopy techniques with the uniquely high chemical sensitivity of secondary ion mass spectroscopy

Nanomechanical spectroscopy in tapping mode atomic force microscopy

Extracting quantitative information at the nanoscale with an efficient force reconstruction method.

Systematically sharpening atomic force microscopy images

Optimising probe excitation frequency for the characterization of soft visoeleastic surfaces.

Imaging atomically precise donor devices inside a silicon crystal

Advancing the fabrication of semiconductor qubits.

Characterizing the subsurface of polymer nanocomposites

Atomic Force Microscopy provides quantitative non-invasive analysis of composite properties.

Dual-tips improve magnetic-field imaging at the nanoscale

Exploring magnetically soft objects with segregated topological and magnetic scans.

Multifrequency atomic force microscopy: material properties on the nanoscale

Analysis of multiple eigenmodes in AFM reveals surface properties.

Theory connects scanning tunnelling techniques

Theoretical descriptions of scanning tunnelling potentiometry could extend the scope of the technique to observe the same features as scanning tunnelling microscopy.

Understanding the signal in electrochemical strain microscopy

Novel technique measures ion concentration and diffusion qualitatively.

Mechanical properties of coal on the nanoscale

Novel atomic force microscopy methods probe the properties of coal.

The voltage drop across atoms

Atomic-scale voltage drop imaging can be used to improve nanoelectronics.

Nanoscale position sensors: spintronics offer a low-cost alternative to optics

Detecting changes in magnetic field for high-speed sensing.

Seeing atoms under viscous conditions

An unexpected route to high-resolution atomic force microscopy

Calibrating the scanning microwave microscope in situ

An easy route to quantitative nanoscale electrical characterisation at GHz frequencies

Improving contact quality in AFM-based electrical measurements

An appropriate loading force is essential in nanoscale electrical characterization by Conductive Atomic Force Microscopy