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Scanning probe microscopy

Sponsored by Bruker Nano Surfaces

PeakForce Tapping™ is the most significant breakthrough in AFM technology since the advent of TappingMode™. By applying a precisely controlled force response curve at every pixel, PeakForce Tapping permits the use of reduced imaging forces, protecting both fragile probes and samples with no decrease in image resolution.

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Lab talk

Nanotechnology research highlights: find out what the authors have to say

Nanoscale position sensors: spintronics offer a low-cost alternative to optics

Detecting changes in magnetic field for high-speed sensing.

Seeing atoms under viscous conditions

An unexpected route to high-resolution atomic force microscopy

Calibrating the scanning microwave microscope in situ

An easy route to quantitative nanoscale electrical characterisation at GHz frequencies

Improving contact quality in AFM-based electrical measurements

An appropriate loading force is essential in nanoscale electrical characterization by Conductive Atomic Force Microscopy

Plasmonic nanoscope measures heterogeneous nanostructures

Scanning plasmonic ridge aperture senses changes in refractive index and absorption of nanostructures, which is useful for detecting voids or defects in a sample.

AFM captures dynamics of photodissolution

Continuous imaging during patterned optical illumination allows surface morphology, roughness and particle size distribution to be spatially and statistically monitored as a function of time.

Model interprets dynamic scanning electron microscopy of vibrating cantilevers

Nano-oscillations analysed to further understand scanning probe microscopy techniques.

Mechanical stability defines imaging quality of nanoprobes

Model guides the selection and design of carbon nanotubes as scanning tips and nanomanipulators.

Resist layer correlation joins up nanopatterns

Surface roughness fingerprint allows sub-nanometre positioning without alignment marks.

SPM tip apex defined using field ion microscopy

Analysis reveals atomic structure at the very apex of the probe and will lead to a better understanding of nanoscale mechanics and electronic transport.

Metal-on-silicon FET exhibits graphene-like properties

Dependence of the drain current on the drain voltage has no saturation region, similar to a field-effect transistor based on graphene.

Algorithm investigates different stable states of cantilever oscillation in AFM

Up to three coexisting stable states identified in latest study, which could help experimentalists to obtain superior images.

High-speed AFM revealed in slow motion

Contact mode cantilever dynamics understood in two-part study.

Feeling the heat of pyroelectricity

AFM operating in electrostatic force microscope mode reveals evolution of force gradients in gemstone placed on thermally cycled heating stage.

Nanowire makes a sensitive force sensor

Computer simulations demonstrate potential of optically trapped cylinders as custom probes

CR-AFM maps stiffness and damping with nanoscale resolution

NIST and Intel team up to image advanced semiconductor interconnection structures.

Nano-ponds modify properties of hexagonal boron nitride layers

Confined water could influence operation of ultra-fast h-BN/graphene transistors

Lissajous scan trajectories speed up scanning probe microscopy

Non-raster scan trajectories give a rapid preview of the entire sample area with a resolution that increases uniformly in time and space

Coaxial Kelvin probe sharpens work-function images

Shielded AFM probe enhances spatial resolution and helps to avoid topographical artifacts by confining the electric field to a region directly below the tip

Understanding nonvolatile memory phenomena in graphene-polymer devices

Embedded multilayer graphene film acts as charge trapping layer and changes the current state of the memory device in response to externally applied bias