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online seminar


Key achievements and challenges in STM and AFM

Mervyn Miles describes achievements in high-resolution high-speed AFM and challenges in applying it to living cells.

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Scanning probe microscopy

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Bruker’s Inspire™ delivers, for the first time, highest-resolution nanoscale chemical and property mapping combined with radical productivity advances and uncompromised AFM performance. The integrated, self-optimizing system acquires nanoscale infrared absorption and reflection maps at regular AFM imaging speeds, without the limitations of indirect mechanical approaches or added complexity for the user.

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Lab talk

Nanotechnology research highlights: find out what the authors have to say

AFM captures dynamics of photodissolution

Continuous imaging during patterned optical illumination allows surface morphology, roughness and particle size distribution to be spatially and statistically monitored as a function of time.

Model interprets dynamic scanning electron microscopy of vibrating cantilevers

Nano-oscillations analysed to further understand scanning probe microscopy techniques.

Mechanical stability defines imaging quality of nanoprobes

Model guides the selection and design of carbon nanotubes as scanning tips and nanomanipulators.

Resist layer correlation joins up nanopatterns

Surface roughness fingerprint allows sub-nanometre positioning without alignment marks.

SPM tip apex defined using field ion microscopy

Analysis reveals atomic structure at the very apex of the probe and will lead to a better understanding of nanoscale mechanics and electronic transport.

Metal-on-silicon FET exhibits graphene-like properties

Dependence of the drain current on the drain voltage has no saturation region, similar to a field-effect transistor based on graphene.

Algorithm investigates different stable states of cantilever oscillation in AFM

Up to three coexisting stable states identified in latest study, which could help experimentalists to obtain superior images.

High-speed AFM revealed in slow motion

Contact mode cantilever dynamics understood in two-part study.

Feeling the heat of pyroelectricity

AFM operating in electrostatic force microscope mode reveals evolution of force gradients in gemstone placed on thermally cycled heating stage.

Nanowire makes a sensitive force sensor

Computer simulations demonstrate potential of optically trapped cylinders as custom probes

CR-AFM maps stiffness and damping with nanoscale resolution

NIST and Intel team up to image advanced semiconductor interconnection structures.

Nano-ponds modify properties of hexagonal boron nitride layers

Confined water could influence operation of ultra-fast h-BN/graphene transistors

Lissajous scan trajectories speed up scanning probe microscopy

Non-raster scan trajectories give a rapid preview of the entire sample area with a resolution that increases uniformly in time and space

Coaxial Kelvin probe sharpens work-function images

Shielded AFM probe enhances spatial resolution and helps to avoid topographical artifacts by confining the electric field to a region directly below the tip

Understanding nonvolatile memory phenomena in graphene-polymer devices

Embedded multilayer graphene film acts as charge trapping layer and changes the current state of the memory device in response to externally applied bias

Nanocomposite study explores link between macro- and nanoscale behaviour

AFM nanoindentation results compared with macroscale tensile testing data to correlate surface properties of cellulose nanocrystal-based composites with bulk performance

Scanning probe lithography: ultrasonic vibration assisted nanomachining with an AFM

Controlled ultrasonic tip-sample vibration increases patterning speed and allows tunable feature dimensions

Probing delicate samples: stiff AFM mechanics at soft forces

Higher-order resonances allow low-force nanomechanical characterization

Biocompatible plasmonic substrates assembled for single-molecule detection

Small clusters of anisotropic silver nanoparticles enveloped in a shell of chitosan biopolymer operate as highly active SERS substrates

Diffraction grating reduces noise of coated AFM cantilevers

Special coating pattern based on Fresnel lens reduces the impact of detection-, force- and displacement-noise in atomic force microscopy