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Scanning probe microscopy

Sponsored by Bruker Nano Surfaces

PeakForce Tapping™ is the most significant breakthrough in AFM technology since the advent of TappingMode™. By applying a precisely controlled force response curve at every pixel, PeakForce Tapping permits the use of reduced imaging forces, protecting both fragile probes and samples with no decrease in image resolution.

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Lab talk

Nanotechnology research highlights: find out what the authors have to say

Multiple-scanning-probe force microscope measures electrical transport in graphene flakes

Four-terminal electrical measurement realized on microscopic structure in air sidesteps the need to lithographically fabricate fixed electrodes

Double-pass force-distance mapping simplifies nanomechanical characterization

Bilkent University team demonstrates a simple method for obtaining high-resolution mechanical maps using AFM set-up

Nanoindentation of myelinated axon evaluates nerve regeneration

Nanomechanical characterization useful for demonstrating structural changes caused by nerve-related diseases

Charge storage observed on mesoscopic graphitic islands

Electrical transport studies reveal unexpected stability of charged state

Rediscovered trapping mechanism favours smaller particles

Under the right conditions AC electrophoresis effects can dominate and lead to more efficient trapping especially for smaller particles or molecules

Single-molecule switching on an insulating surface

Room-temperature manipulation using non-contact AFM could ultimately benefit molecular electronics applications

Planar structure extends lifetime of memristor

Embedded bottom electrode improves endurance of non-volatile memory candidate by permitting kink-free switching layer and top electrode

HV-SSRM profiles carriers in nanowire-based transistors

Imec group maps quantitatively the distribution of active dopants in confined 3D-volumes

Simple EBID process delivers robust nanoneedle AFM probe

Shock-absorbing properties of free-standing carbon pillar suit imaging of challenging samples including biological material

Commercial upright microscope integrated with AFM for TERS study

Optical mask and "tip at the end of the cantilever" accommodate non-transparent samples

Force scanning: quick maps and measurements of living cells

Versatile AFM technique gives high-resolution, spatial modulus maps at micro- and nanoscales

Tip measures nanochannel kinetics in thin water films

AFM inscribes gratings on ice-like islands on a mica substrate at room temperature

Hydro-tweezers build nanodevices

Flow scheme aligns individual nanowires ready for assembly

Bimodal imaging reveals 5 nm superparamagnetic proteins in liquid

Force microscope exploits nanomechanical coupling regime to detect and image core-shell particles in liquid

Digging up metallic nanoparticles with an electron beam

Fast growth of superparamagnetic iron nanoclusters by ion implantation and electron beam annealing could benefit magnetic field sensing and data storage

Near-field thermal transport in laser-irradiated nanotips

Poynting vector analysis by Iowa State University team reveals strong effect of taper angle on thermal transport

Finding a needle in a chemical haystack

Tip-enhanced Raman scattering differentiates between various SWCNTs and amorphous carbon contamination in a prepared mixture

Frequency-modulated SPM quantifies energy dissipation

Method compensates for frequency dispersion of piezo actuators to pinpoint dissipation detail

Real-time monitoring of angstrom-scale surface roughness

Scattering technique speeds up analysis of near-field etching

Vibrating edge cuts nanopatterns from viscoelastic block

Tunable, large-area technique fabricates wavy structures as small as 36 nm and suits slightly curved surfaces