Scanning probe microscopy
Sponsored by Bruker Nano Surfaces
PeakForce Tapping™ is the most significant breakthrough in AFM technology since the advent of TappingMode™. By applying a precisely controlled force response curve at every pixel, PeakForce Tapping permits the use of reduced imaging forces, protecting both fragile probes and samples with no decrease in image resolution.
Breaking research and industry highlightsTechnology update RSS feed
Apr 29, 2014
Recycling laser power using an interferometer provides single-molecule biophysicists with multiple optical traps that are stable and less energy intensive than previous approaches.
Mar 21, 2014
Low intensity lasers manipulate objects the size of a virus
May 29, 2013
Pump-probe technique beats the diffraction limit of light – without the need for labels
Feb 8, 2013
Molecular samples detected and imaged at room temperature.
Dec 14, 2012
Find out which nanotechnology breakthroughs made it into our review of the year.
Nov 16, 2012
Wax-infused nanotube "yarns" could find use in robotics, micromotors and intelligent textiles.
Jul 31, 2012
Director of the Centre for Nanoscience & Quantum Information at University of Bristol, UK, to advise publishing arm of the Institute of Physics
Jul 26, 2012
Miniaturized scanning setup captures movement of biological molecules with unprecedented resolution.
Aug 31, 2011
Magnetic trap could help scientists perform microfluidic experiments
Jun 10, 2010
New, simple and fast technique could be used to make flexible electronic circuits from carbon sheets
Jun 1, 2010
Seoul National University group takes a closer look at resistance-switching random access memory (RRAM)
Mar 9, 2010
Torsion resonance (TR) feedback isolates performance-enhancing tip-sample interaction
Dec 2, 2009
Automatic recognition process exploits broadband electromechanical response of cellular organisms
Nov 3, 2009
Design unveiled for grabbing and holding a nanoscale particle in water without touching it
Oct 13, 2009
Custom-built interferometric AFM deflection sensor captures dissipation process
Oct 6, 2009
Method can be applied using any commercial AFM to quantify the dielectric constant of thin films
Oct 1, 2009
"Active" diamond nanocrystal tips provide high resolution images of metallic nanostructures
Sep 17, 2009
Hot AFM probe can pattern sub-30 nm structures