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Editor's choice

Optically trapped microspheres write nanofeatures on bumpy surfaces May 8, 2012

Near-field focused laser beam can pattern rough or uneven surfaces

Technology update

Graphite foam makes good battery electrode

Ultralight structure has higher energy and power densities than many conventional cathode materials

Noise helps graphene detect gases

New sensor can distinguish between different gases without the need for surface functionalization

A cracking approach to nanotechnology

Cracks are exploited to carve out patterns in silicon

Graphene-QD photodetector breaks new record

Hybrid device is a billion times more sensitive to light

Silver nanoparticle shape affects toxicity

Plate-shaped silver nanomaterials are potentially more dangerous than spheres or wires, but only when in direct contact with cells

Courses and events

Nanofair 2012 - 9th International Nanotechnology Symposium

1213 Jun 2012, Dresden, Sachsen, Germany.

International Scanning Probe Microscopy Meeting

1518 Jun 2012, Toronto, Ontario, Canada.

ISPM 2012

1518 Jun 2012, Toronto, ON, Canada.

Industrial Technologies 2012

1921 Jun 2012, Aarhus, Denmark.

AFM in Single Cell Adhesion and Mechanics

20 Jun 2012, Berlin, Berlin, Germany.

Nano highlights

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Buyer’s Guide

In depth

Show report: nano tech 2012, Tokyo

Leaders from academia, industry and government agencies gather at the world's largest nanotech event

The story of graphene

Yvette Hancock documents the remarkable properties of graphene and rounds up some of the potential applications that have grabbed the attention of scientists worldwide

White papers

Surface roughness measurement of media and substrate

A white paper from Park Systems.

True Sample Topography Acquired by Low-Noise Z Position Sensor

A white paper from Park Systems.

A Tour of the Hiden SIMS Workstation

A white paper from Hiden Analytical.

Zeta Potential Analysis using Z-NTA

A white paper from NanoSight.

SIMS Imaging of Semiconductor Contact Pads

A white paper from Hiden Analytical

Multimedia

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EV Group (EVG)

Solutions for 3D Integration and TSV (Through-Silicon Via)

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Asylum Research

Introducing the Cypher Atomic Force Microscope – the World’s highest Resolution AFM

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