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Editor's choice

Electrical sintering joins up nanoparticles May 13, 2008

Rapid process is ideal for temperature-sensitive substrates

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Technology update

Nano-encapsulation gives UV protection May 15, 2008

UV-resistant polymeric formulation suits controlled release of topical applications

IBM researchers see quantized conductance in graphene May 14, 2008

Real-world graphene nanodevices move a step closer

Electrical sintering joins up nanoparticles May 13, 2008

Rapid process is ideal for temperature-sensitive substrates

Magnetic refrigeration moves on May 12, 2008

Nanocomposites produced from metallic glasses show promise as refrigerant materials

"Parametron" comes back to life May 9, 2008 1 comment

Japanese researchers take first step towards making a nanomechanical computer

Courses and events

5th International Conference on Semiconductor Quantum Dots

1116 May 2008, Gyeongju, Korea, Republic of.

Biosensors 2008

1416 May 2008, Shanghai, China.

21th ECS Meeting 213th ECS Meeting

1823 May 2008, Phoenix, Arizona, United States.

RAPID 2008 Conference & Exposition

2022 May 2008, Lake Buena Vista, Florida, United States.

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Nanotechnology journal

Nanotechnology journal

Lab talk: Encoding information in light from silicon quantum dots

Apr 28, 2008

Silicon photonics is the technology of signal processing, transmission and detection...

In depth

Novel thin films target device applications May 6, 2008

E Fred Schubert and colleagues reveal why changing the inclination of nanorods on a substrate could benefit solar cells and LEDs

Nano-engineering biocompatible materials Apr 22, 2008

Lucy Bosworth discusses how electrospun fibres with diameters ranging from nanometres to microns could help restore damaged tissue

White papers

Needle Sensor Operation in non-contact AFM Mode May 15, 2008

by L.Bolotov, AIST, Tsukuba, Japan Non-contact AFM at a resonance frequency of 1MHz with frequency shifts below 500mHz. Omicron LT-STM.

Single pass Kelvin Probe Measurement Technique in Air with Dual-OC4 May 15, 2008

by H.Diesinger, D.Deresmes, and Th. Melin, IEMN, Lille, France

Compensating for CPD in NC-AFM: AM-KPFM in UHV using Dual - OC4 May 15, 2008

by Th. Glatzel and E. Meyer, University of Basel, Switzerland

Hybrid nanopositioning mechanism combines advantages of dc-servo and piezo drive technology Apr 24, 2008

Physik Instrumente

Accurate quantitative thin film depth profiling by ion beam analysis Apr 10, 2008

Chris Jeynes, University of Surrey Ion Beam Centre

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Closing date: May 16, 2008
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Closing date: May 24, 2008
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