New look buyers guide - now live
Nanomaterials, characterization equipment and much more. To start exploring and to add your latest product or service, click here
Nanotechnology journal
Lab talk: Encoding information in light from silicon quantum dots
Apr 28, 2008Silicon photonics is the technology of signal processing, transmission and detection...
In depth
Novel thin films target device applications May 6, 2008
E Fred Schubert and colleagues reveal why changing the inclination of nanorods on a substrate could benefit solar cells and LEDs
Nano-engineering biocompatible materials Apr 22, 2008
Lucy Bosworth discusses how electrospun fibres with diameters ranging from nanometres to microns could help restore damaged tissue
White papers
Needle Sensor Operation in non-contact AFM Mode May 15, 2008
by L.Bolotov, AIST, Tsukuba, Japan Non-contact AFM at a resonance frequency of 1MHz with frequency shifts below 500mHz. Omicron LT-STM.
Single pass Kelvin Probe Measurement Technique in Air with Dual-OC4 May 15, 2008
by H.Diesinger, D.Deresmes, and Th. Melin, IEMN, Lille, France
Compensating for CPD in NC-AFM: AM-KPFM in UHV using Dual - OC4 May 15, 2008
by Th. Glatzel and E. Meyer, University of Basel, Switzerland
Hybrid nanopositioning mechanism combines advantages of dc-servo and piezo drive technology Apr 24, 2008
Physik Instrumente
Accurate quantitative thin film depth profiling by ion beam analysis Apr 10, 2008
Chris Jeynes, University of Surrey Ion Beam Centre
Jobs
Engineer - Equipment and Process Development - Nanotechnology - Guildford, Surrey
Posting date: May 15, 2008
Closing date: May 16, 2008
Guildford,
Surrey,
United Kingdom
Santa Rosa Technology Center Internship - Santa Rosa, CA
Posting date: Mar 25, 2008
Closing date: May 24, 2008
Santa Rosa,
California,
United States