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The Dimension FastScanTM Atomic Force Microscope (AFM) delivers, for the first time, extreme imaging speed without sacrificing legendary Dimension© Icon© resolution and performance.
Park Systems, a leader in Atomic Force Microscopy (AFM) since 1997 announces their first AFM image contest winner, Namuna Panday, a Graduate Student at Florida International University.
Park Systems New Atomic Force Microscope Technology Surpasses Old Standards
Park Systems Mar 5, 2014
Park Systems New Atomic Force Microscope Technology Surpasses Old Standards for Semiconductor Failure Analysis Detection Ensuring Accuracy and Lowering Costs.
Powerfully Versatile Atomic Force Microscope with Unique MultiSampleTM Scan
Columbus, Ohio (January 23, 2014)- Lake Shore slated to receive Phase II Air Force grant for terahertz system development.
Nanosurf AG Jan 15, 2014
An all-in-one AFM for nano education and small samples.
- Building on our extensive catalogue of incoherent light sources (Xe, Hg(Xe), QTH)
NEW ILT950 UV Spectroradiometer
LOT-QuantumDesign Ltd Jan 14, 2014
The excellent performance of the original ILT950 spectroradiometer has been enhanced with the addition of a new machined optical bench for reduced stray light and improved thermal stability.
Park Systems Unveils New Park XE15
Park Systems Jan 6, 2014
Powerfully Versatile Atomic Force Microscope with Unique MultiSample™ Scan.
Park Systems Introduces QuickStep SCM
Park Systems Dec 2, 2013
New High Speed Scanning Capacitance Microscopy